Style Name:YUT2620

Echo-echo Method: No need of zero calibration, the net thickness of the base material can be directly measured through the coating

Wave Crest Memory: Real time envelopes show the highest wave of the flaws and record the maximum value of the flaws, it is helpful to exact positioning and fast testing of the flaws

Automatic Gain: Automatically adjust the gain to the preset amplitude height

Alarming Function: Afferent echo/echo loss alarming

Solid waveform: The solid waveform can enchancing the waveform visual contrast so the omission will hardly happen during the fast testing

Real-time Clock: Automatically record the date and time of the stored waveforms

Display Freezing: Catching the waveform and sound path data at any moment

Flaw Positioning: Real-time displaying the sound path S, horizontal height X, depth Y, and wave height H

Flaw Quantify: Real time display the dB difference value and sl quantitative value

Digital Inhibition: 0-80%, increasing by 1%, not affecting the linearity and gain

DAC/AVG Curve Functions: Perfect DAC curve functions enable the curves to change along with the changes of the gain, sound path, and displacement

Transverse wave Testing Method: When using transverse wave to detect flaws, the depths of the second and third waves are automatically calculated according to the slab thickness

Distance Compensation: When the resolving power in the near field is not influenced, only the remote signal will be compensated for its sensitivity so as to improve the testing range of the device significantly

Φ Value Calculation: This function is used for calculating the flaw quivalent

Languages: Chinese and English

Data Communication: Communicating with the computer via RS232 interface to transfer the waveform and data